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Atom Probe Studi tomografia sul Cu (In, Ga) se<sub> 2</sub> Bordi di grano
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JoVE Journal Engineering
Atom Probe Tomography Studies on the Cu(In,Ga)Se2 Grain Boundaries
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Atom Probe Studi tomografia sul Cu (In, Ga) se<sub> 2</sub> Bordi di grano

italiano

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12,573 Views

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09:51 min

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April 22, 2013

DOI:

10.3791/50376-v

DOI:
10.3791/50376-v

•

09:51 min
April 22, 2013

•

1 Views
, , , , ,
1Department of Microstructure Physics and Alloy Design,Max-Planck-Institut für Eisenforschung GmbH, 2Zentrum für Sonnenenergie- und Wasserstoff-Forschung Baden-Württemberg ( ZSW )

Summary

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In questo lavoro, si descrive l'uso della tecnica tomografia atomo-sonda per studiare i bordi grano dello strato assorbitore in una cella solare CIGS. Un nuovo approccio per preparare le punte della sonda atomo contenenti il ​​bordo di grano desiderata con una struttura nota è anche presentato qui.

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Cite this Article

Cojocaru-Mirédin, O., Schwarz, T., Choi, P., Herbig, M., Wuerz, R., Raabe, D. Atom Probe Tomography Studies on the Cu(In,Ga)Se2 Grain Boundaries. J. Vis. Exp. (74), e50376, doi:10.3791/50376 (2013).

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