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Karakterisering van SiN Integrated Optical Phased Arrays op een wafer-scale teststation
JoVE Journal
Engineering
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JoVE Journal Engineering
Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
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Karakterisering van SiN Integrated Optical Phased Arrays op een wafer-scale teststation

Nederlands

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7,735 Views

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05:57 min

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April 01, 2020

DOI:

10.3791/60269-v

DOI:
10.3791/60269-v

•

05:57 min
April 01, 2020

•

4 Views
, , , , , ,
1University Grenoble Alpes and CEA, LETI, Minatec Campus

Summary

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Hier beschrijven we de werking van een SiN geïntegreerd fotonisch circuit met optische gefaseerde arrays. De circuits worden gebruikt om lage divergentie laserstralen uit te zenden in de buurt infrarood en sturen ze in twee dimensies.

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Cite this Article

Tyler, N. A., Guerber, S., Fowler, D., Malhouitre, S., Garcia, S., Grosse, P., Szelag, B. Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station. J. Vis. Exp. (158), e60269, doi:10.3791/60269 (2020).

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