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Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
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Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station

DOI:
10.3791/60269-v

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05:57 min

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April 01, 2020

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, , , , , ,
1University Grenoble Alpes and CEA, LETI, Minatec Campus

Capítulos

  • 00:05Introduction
  • 00:36Optical Coupling: Fiber Alignment
  • 01:25Optical Coupling: Optical Phase Array (OPA) Output Imaging
  • 02:14Beam Optimization and Steering
  • 04:05Beam Divergence Measurement Imaging
  • 04:30Results: Representative Silicon Nitride (SiN) Integrated OPA Characterization
  • 05:20Conclusion

Summary

Traducción Automática

Traducción Automática

Here, we describe the operation of a SiN integrated photonic circuit containing optical phased arrays. The circuits are used to emit low divergence laser beams in the near infrared and steer them in two dimensions.

Tags

Keywords: SiN Integrated Optical Phased ArraysWafer-scale CharacterizationAutomated TestingBeam-steering CircuitsProber StationGrating CouplerFar-field ImagingPhase ControlBeam SteeringRing Resonators

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