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Vervoerder levensduur metingen in halfgeleiders via de magnetron Photoconductivity verval methode
JoVE Journal
Engineering
This content is Free Access.
JoVE Journal Engineering
Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method
DOI:

07:38 min

April 18, 2019

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Chapters

  • 00:04Title
  • 00:49Preparation of the Sample and Aqueous Solutions
  • 01:44Preparation of the Measuring Equipment
  • 03:36Measurement and Data Processing
  • 05:47Results: Normalized and Calculated μ-PCD Decay Curves for the n-type 4H-SIC Sample in Air and Aqueous Solutions
  • 06:29Conclusion

Summary

Automatic Translation

Als een van de belangrijke fysieke parameters in halfgeleiders, is vervoerder levensduur hierin gemeten via een protocol met de magnetron photoconductivity verval methode.

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