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Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method
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Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method
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April 18, 2019
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As one of the important physical parameters in semiconductors, carrier lifetime is measured herein via a protocol employing the microwave photoconductivity decay method.
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Asada, T., Ichikawa, Y., Kato, M. Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method. J. Vis. Exp. (146), e59007, doi:10.3791/59007 (2019).
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