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Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method
JoVE Journal
Ingenieurwesen
This content is Free Access.
JoVE Journal Ingenieurwesen
Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method

Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method

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07:38 min

April 18, 2019

DOI:

07:38 min
April 18, 2019

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Summary

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As one of the important physical parameters in semiconductors, carrier lifetime is measured herein via a protocol employing the microwave photoconductivity decay method.

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