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Güneş Pillerinin Çok Modal X-ışını Mikroskobu için X-ışını Indüklenen Akım Ölçümleri
JoVE Journal
Engineering
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JoVE Journal Engineering
X-ray Beam Induced Current Measurements for Multi-Modal X-ray Microscopy of Solar Cells
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Güneş Pillerinin Çok Modal X-ışını Mikroskobu için X-ışını Indüklenen Akım Ölçümleri

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13,241 Views

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00:10 min

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August 20, 2019

DOI:

10.3791/60001-v

DOI:
10.3791/60001-v

•

00:10 min
August 20, 2019

•

6 Views
, , , , , ,
1Deutsches Elektronen-Synchrotron, 2School of Electrical, Computer and Energy Engineering,Arizona State University, 3Department Physik,Universität Hamburg

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Cite this Article

Ossig, C., Nietzold, T., West, B., Bertoni, M., Falkenberg, G., Schroer, C. G., Stuckelberger, M. E. X-ray Beam Induced Current Measurements for Multi-Modal X-ray Microscopy of Solar Cells. J. Vis. Exp. (150), e60001, doi:10.3791/60001 (2019).

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