/
/
X-ray Beam Induced Current Measurements for Multi-Modal X-ray Microscopy of Solar Cells
This content is Free Access.
X-ray Beam Induced Current Measurements for Multi-Modal X-ray Microscopy of Solar Cells
13,323 Views
•
00:10 min
•
August 20, 2019
DOI:
Özet
Automatically generated
A setup for X-ray beam induced current measurements at synchrotron beamlines is described. It unveils the nanoscale performance of solar cells and extends the suite of techniques for multi-modal X-ray microscopy. From wiring to signal-to-noise optimization, it is shown how to perform state-of-the-art XBIC measurements at a hard X-ray microprobe.
Read Article
Cite this Article
Ossig, C., Nietzold, T., West, B., Bertoni, M., Falkenberg, G., Schroer, C. G., Stuckelberger, M. E. X-ray Beam Induced Current Measurements for Multi-Modal X-ray Microscopy of Solar Cells. J. Vis. Exp. (150), e60001, doi:10.3791/60001 (2019).
Copy