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X-ray Beam Induced Current Measurements for Multi-Modal X-ray Microscopy of Solar Cells
JoVE Journal
工学
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JoVE Journal 工学
X-ray Beam Induced Current Measurements for Multi-Modal X-ray Microscopy of Solar Cells

X-ray Beam Induced Current Measurements for Multi-Modal X-ray Microscopy of Solar Cells

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00:10 min

August 20, 2019

DOI:

00:10 min
August 20, 2019

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概要

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A setup for X-ray beam induced current measurements at synchrotron beamlines is described. It unveils the nanoscale performance of solar cells and extends the suite of techniques for multi-modal X-ray microscopy. From wiring to signal-to-noise optimization, it is shown how to perform state-of-the-art XBIC measurements at a hard X-ray microprobe.

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