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X-ray Beam Induced Current Measurements for Multi-Modal X-ray Microscopy of Solar Cells
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工学
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JoVE Journal 工学
X-ray Beam Induced Current Measurements for Multi-Modal X-ray Microscopy of Solar Cells

X-ray Beam Induced Current Measurements for Multi-Modal X-ray Microscopy of Solar Cells

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00:10 min

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August 20, 2019

DOI:

10.3791/60001-v

DOI:
10.3791/60001-v

•

00:10 min
August 20, 2019

•

17 Views
, , , , , ,
1Deutsches Elektronen-Synchrotron, 2School of Electrical, Computer and Energy Engineering,Arizona State University, 3Department Physik,Universität Hamburg

概要

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A setup for X-ray beam induced current measurements at synchrotron beamlines is described. It unveils the nanoscale performance of solar cells and extends the suite of techniques for multi-modal X-ray microscopy. From wiring to signal-to-noise optimization, it is shown how to perform state-of-the-art XBIC measurements at a hard X-ray microprobe.

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Cite this Article

Ossig, C., Nietzold, T., West, B., Bertoni, M., Falkenberg, G., Schroer, C. G., Stuckelberger, M. E. X-ray Beam Induced Current Measurements for Multi-Modal X-ray Microscopy of Solar Cells. J. Vis. Exp. (150), e60001, doi:10.3791/60001 (2019).

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