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走査プローブ単電子容量分光

JoVE Journal
Engineering

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JoVE Journal Engineering

Scanning-probe Single-electron Capacitance Spectroscopy

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走査プローブ単電子容量分光

12,898 Views

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10:53 min

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July 30, 2013

DOI:

10.3791/50676-v

DOI:

10.3791/50676-v

•

10:53 min

July 30, 2013

•

5 Views

Kathleen A. Walsh¹, Megan E. Romanowich¹, Morewell Gasseller^1,2, Irma Kuljanishvili^1,3, Raymond Ashoori⁴, Stuart Tessmer¹

¹Department of Physics and Astronomy,Michigan State University, ²Department of Chemistry & Biochemistry/Physics,Mercyhurst University, ³Department of Physics,Saint Louis University, ⁴Department of Physics,Massachusetts Institute of Technology

Summary

走査プローブ単電子容量分光法は、ローカライズされた地下の地域での単一電子の運動の研究を促進する。敏感な電荷検出回路は、半導体試料の表面の下にドーパント原子の小規模システムを調査するために極低温走査型プローブ顕微鏡に組み込まれる。

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