/

/

走査プローブ単電子容量分光

JoVE Journal
Engineering

A subscription to JoVE is required to view this content. Sign in or start your free trial.

JoVE Journal Engineering

Scanning-probe Single-electron Capacitance Spectroscopy

Please note that all translations are automatically generated. Click here for the English version.

走査プローブ単電子容量分光

12,890 Views

•

10:53 min

•

July 30, 2013

DOI:

10.3791/50676-v

DOI:

10.3791/50676-v

•

10:53 min

July 30, 2013

•

5 Views

Kathleen A. Walsh¹, Megan E. Romanowich¹, Morewell Gasseller^1,2, Irma Kuljanishvili^1,3, Raymond Ashoori⁴, Stuart Tessmer¹

¹Department of Physics and Astronomy,Michigan State University, ²Department of Chemistry & Biochemistry/Physics,Mercyhurst University, ³Department of Physics,Saint Louis University, ⁴Department of Physics,Massachusetts Institute of Technology

Summary

走査プローブ単電子容量分光法は、ローカライズされた地下の地域での単一電子の運動の研究を促進する。敏感な電荷検出回路は、半導体試料の表面の下にドーパント原子の小規模システムを調査するために極低温走査型プローブ顕微鏡に組み込まれる。

Explore More Videos

Scanning-probe Single-electron Capacitance Spectroscopy Electronic Quantum Structure Subsurface Charge Accumulation (SCA) Imaging Spatial Resolution Charge Resolution HEMT Cryogenic Temperatures

Read Article