Un abonnement à JoVE est nécessaire pour voir ce contenu. Connectez-vous ou commencez votre essai gratuit.
Scanning-probe Single-electron Capacitance Spectroscopy
12,898 Views
•
10:53 min
•
July 30, 2013
DOI:
Summary
Automatically generated
Scanning-probe single-electron capacitance spectroscopy facilitates the study of single-electron motion in localized subsurface regions. A sensitive charge-detection circuit is incorporated into a cryogenic scanning probe microscope to investigate small systems of dopant atoms beneath the surface of semiconductor samples.
Read Article
Cite this Article
Walsh, K. A., Romanowich, M. E., Gasseller, M., Kuljanishvili, I., Ashoori, R., Tessmer, S. Scanning-probe Single-electron Capacitance Spectroscopy. J. Vis. Exp. (77), e50676, doi:10.3791/50676 (2013).
Copy