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Scanning-probe Single-electron Capacitance Spectroscopy
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工程学
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JoVE 杂志 工程学
Scanning-probe Single-electron Capacitance Spectroscopy

Scanning-probe Single-electron Capacitance Spectroscopy

12,890 Views

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10:53 min

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July 30, 2013

DOI:

10.3791/50676-v

DOI:
10.3791/50676-v

•

10:53 min
July 30, 2013

•

5 Views
, , , , ,
1Department of Physics and Astronomy,Michigan State University, 2Department of Chemistry & Biochemistry/Physics,Mercyhurst University, 3Department of Physics,Saint Louis University, 4Department of Physics,Massachusetts Institute of Technology

Summary

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Scanning-probe single-electron capacitance spectroscopy facilitates the study of single-electron motion in localized subsurface regions. A sensitive charge-detection circuit is incorporated into a cryogenic scanning probe microscope to investigate small systems of dopant atoms beneath the surface of semiconductor samples.

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Cite this Article

Walsh, K. A., Romanowich, M. E., Gasseller, M., Kuljanishvili, I., Ashoori, R., Tessmer, S. Scanning-probe Single-electron Capacitance Spectroscopy. J. Vis. Exp. (77), e50676, doi:10.3791/50676 (2013).

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