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Scanning-Probe-Einzel-Elektronen-Spektroskopie Kapazität
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JoVE Journal Engineering
Scanning-probe Single-electron Capacitance Spectroscopy
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Scanning-Probe-Einzel-Elektronen-Spektroskopie Kapazität

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12,890 Views

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10:53 min

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July 30, 2013

DOI:

10.3791/50676-v

DOI:
10.3791/50676-v

•

10:53 min
July 30, 2013

•

5 Views
, , , , ,
1Department of Physics and Astronomy,Michigan State University, 2Department of Chemistry & Biochemistry/Physics,Mercyhurst University, 3Department of Physics,Saint Louis University, 4Department of Physics,Massachusetts Institute of Technology

Summary

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Scanning-Probe-Einzel-Elektronen-Spektroskopie Kapazität ermöglicht die Untersuchung von Einzel-Elektronen-Bewegung in lokalisierten Regionen Untergrund. Eine empfindliche Ladung-Erfassungsschaltung in einem kryogenen Rastersondenmikroskop auf kleine Systeme Dotieratome unter der Oberfläche des Halbleiter-Proben zu untersuchen eingearbeitet.

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Cite this Article

Walsh, K. A., Romanowich, M. E., Gasseller, M., Kuljanishvili, I., Ashoori, R., Tessmer, S. Scanning-probe Single-electron Capacitance Spectroscopy. J. Vis. Exp. (77), e50676, doi:10.3791/50676 (2013).

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