Journal
/
Engineering
/
Scanning-Probe-Einzel-Elektronen-Spektroskopie Kapazität
JoVE Journal
Engineering
A subscription to JoVE is required to view this content.  Sign in or start your free trial.
JoVE Journal Engineering
Scanning-probe Single-electron Capacitance Spectroscopy
Please note that all translations are automatically generated. Click here for the English version.

Scanning-Probe-Einzel-Elektronen-Spektroskopie Kapazität

Deutsch

Automatically Generated

12,898 Views

•

10:53 min

•

July 30, 2013

DOI:

10.3791/50676-v

DOI:
10.3791/50676-v

•

10:53 min
July 30, 2013

•

5 Views
, , , , ,
1Department of Physics and Astronomy,Michigan State University, 2Department of Chemistry & Biochemistry/Physics,Mercyhurst University, 3Department of Physics,Saint Louis University, 4Department of Physics,Massachusetts Institute of Technology

Summary

Automatically generated

Scanning-Probe-Einzel-Elektronen-Spektroskopie Kapazität ermöglicht die Untersuchung von Einzel-Elektronen-Bewegung in lokalisierten Regionen Untergrund. Eine empfindliche Ladung-Erfassungsschaltung in einem kryogenen Rastersondenmikroskop auf kleine Systeme Dotieratome unter der Oberfläche des Halbleiter-Proben zu untersuchen eingearbeitet.

Explore More Videos

Scanning-probeSingle-electronCapacitance SpectroscopyElectronic Quantum StructureSubsurface Charge Accumulation (SCA) ImagingSpatial ResolutionCharge ResolutionHEMTCryogenic Temperatures

Read Article

Cite this Article

Walsh, K. A., Romanowich, M. E., Gasseller, M., Kuljanishvili, I., Ashoori, R., Tessmer, S. Scanning-probe Single-electron Capacitance Spectroscopy. J. Vis. Exp. (77), e50676, doi:10.3791/50676 (2013).

Download .ris file

Copy

Share Video

.

Copy