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C 프로빙<sub> (84)</sub>은 스캐닝 프로브 현미경 및 분자 역학을 사용하여 실리콘 기판을 - 임베디드
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Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics
DOI:

13:58 min

September 28, 2016

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Chapters

  • 00:05Title
  • 01:21Fabrication of Hexagonal-closed-packaged (HCP) Overlayer of C84 in Si Substrate
  • 02:57Measurements of Electronic Properties of C84-embedded Si Substrate
  • 05:07Measurements of Surface Magnetism
  • 06:17Measurements of Nanomechanical Properties by AFM
  • 06:49Measurement of Nanomechanical Properties by Molecular Dynamics Simulation
  • 11:05Results: Characterization of C84-embedded Silicon Substrate by Nanomeasurements and Molecular Dynamic Simulation
  • 12:46Conclusion

Summary

자동 번역

This paper reports the nanomaterial fabrication of a fullerene Si substrate inspected and verified by nanomeasurements and molecular dynamic simulation.

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