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Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics
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Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics

Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics

English

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11,564 Views

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13:58 min

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September 28, 2016

DOI:

10.3791/54235-v

DOI:
10.3791/54235-v

•

13:58 min
September 28, 2016

•

12 Views
, , , ,
1Department of Physics and Institute of Nanoscience,National Chung Hsing University, 2Metallurgy Section, Materials & Electro-Optics Research Division,National Chung-Shan Institute of Science and Technology, 3National Center for High-Performance Computing

Summary

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This paper reports the nanomaterial fabrication of a fullerene Si substrate inspected and verified by nanomeasurements and molecular dynamic simulation.

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Ho, M., Huang, C., Tsai, J., Chou, C., Lee, W. Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics. J. Vis. Exp. (115), e54235, doi:10.3791/54235 (2016).

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