Probing C<sub>84</sub>-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics

Mon-Shu Ho; Chih-Pong Huang; Jyun-Hwei Tsai; Che-Fu Chou; Wen-Jay Lee

doi:10.3791/54235

Journal

/

Ingeniería

/

Probing C₈₄-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics

JoVE Revista
Ingeniería

Se requiere una suscripción a JoVE para ver este contenido. Inicie sesión o comience su prueba gratuita.

JoVE Revista Ingeniería

Probing C₈₄-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics

11,564 Views

•

13:58 min

•

September 28, 2016

DOI:

10.3791/54235-v

DOI:

10.3791/54235-v

•

13:58 min

September 28, 2016

•

12 Views

Mon-Shu Ho¹, Chih-Pong Huang², Jyun-Hwei Tsai³, Che-Fu Chou¹, Wen-Jay Lee³

¹Department of Physics and Institute of Nanoscience,National Chung Hsing University, ²Metallurgy Section, Materials & Electro-Optics Research Division,National Chung-Shan Institute of Science and Technology, ³National Center for High-Performance Computing

Summary

This paper reports the nanomaterial fabrication of a fullerene Si substrate inspected and verified by nanomeasurements and molecular dynamic simulation.

Explore More Videos

C84-embedded Si Substrate Scanning Probe Microscopy Molecular Dynamics Nanomaterials Nanostructures Silicon (111) Substrate C84 Deposition Fullerene UHV-STM Heterojunction Electronic Properties Optoelectronic Properties Mechanical Properties Magnetic Properties Field Emission Properties

Read Article

Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics

Summary

Automatically generated

Explore More Videos

Probing C₈₄-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics