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Optimizing Magnetic Force Microscopy Resolution and Sensitivity to Visualize Nanoscale Magnetic Domains
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Engineering
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Optimizing Magnetic Force Microscopy Resolution and Sensitivity to Visualize Nanoscale Magnetic Domains

Optimizing Magnetic Force Microscopy Resolution and Sensitivity to Visualize Nanoscale Magnetic Domains

English

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2,365 Views

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07:42 min

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July 20, 2022

DOI:

10.3791/64180-v

DOI:
10.3791/64180-v

•

07:42 min
July 20, 2022

•

19 Views
, , , ,
1Micron School of Materials Science & Engineering,Boise State University, 2Department of Physics and Astronomy,University of Delaware, 3Center for Advanced Energy Studies

Summary

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Magnetic force microscopy (MFM) employs a vertically magnetized atomic force microscopy probe to measure sample topography and local magnetic field strength with nanoscale resolution. Optimizing MFM spatial resolution and sensitivity requires balancing decreasing lift height against increasing drive (oscillation) amplitude, and benefits from operating in an inert atmosphere glovebox.

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Cite this Article

Parker, A. C., Maryon, O. O., Kaffash, M. T., Jungfleisch, M. B., Davis, P. H. Optimizing Magnetic Force Microscopy Resolution and Sensitivity to Visualize Nanoscale Magnetic Domains. J. Vis. Exp. (185), e64180, doi:10.3791/64180 (2022).

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