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Optimizing Magnetic Force Microscopy Resolution and Sensitivity to Visualize Nanoscale Magnetic Domains
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Optimizing Magnetic Force Microscopy Resolution and Sensitivity to Visualize Nanoscale Magnetic Domains

Optimizing Magnetic Force Microscopy Resolution and Sensitivity to Visualize Nanoscale Magnetic Domains

DOI:
10.3791/64180-v

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07:42 min

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July 20, 2022

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, , , ,
1Micron School of Materials Science & Engineering,Boise State University, 2Department of Physics and Astronomy,University of Delaware, 3Center for Advanced Energy Studies

Capítulos

  • 00:04Introduction
  • 01:00MFM Probe Preparation and Installation
  • 02:35Sample Preparation, Installation, and Sample Approach
  • 03:27Topography Imaging
  • 04:33MFM Imaging
  • 06:23Results: MFM Imaging of Magnetic Twin Boundaries in a Single Crystal Ni-Mn-Ga Sample
  • 06:58Conclusion

Summary

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Magnetic force microscopy (MFM) employs a vertically magnetized atomic force microscopy probe to measure sample topography and local magnetic field strength with nanoscale resolution. Optimizing MFM spatial resolution and sensitivity requires balancing decreasing lift height against increasing drive (oscillation) amplitude, and benefits from operating in an inert atmosphere glovebox.

Tags

Magnetic Force MicroscopyMFMNanoscaleMagnetic DomainsSpin-wave ComputingArtificial Spin IcesMagnetization TexturesHigh-resolution MFMAFM ProbeMagnetic CoatingVertically MagnetizedLaser AlignmentPosition-sensitive DetectorSample Holder

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