Rivista
/
Ingegneria
/
Optimizing Magnetic Force Microscopy Resolution and Sensitivity to Visualize Nanoscale Magnetic Domains
JoVE Journal
Ingegneria
Author Produced
È necessario avere un abbonamento a JoVE per visualizzare questo.  Accedi o inizia la tua prova gratuita.
JoVE Journal Ingegneria
Optimizing Magnetic Force Microscopy Resolution and Sensitivity to Visualize Nanoscale Magnetic Domains

Optimizing Magnetic Force Microscopy Resolution and Sensitivity to Visualize Nanoscale Magnetic Domains

2,365 Views

•

07:42 min

•

July 20, 2022

DOI:

10.3791/64180-v

DOI:
10.3791/64180-v

•

07:42 min
July 20, 2022

•

19 Views
, , , ,
1Micron School of Materials Science & Engineering,Boise State University, 2Department of Physics and Astronomy,University of Delaware, 3Center for Advanced Energy Studies

Summary

Automatically generated

Magnetic force microscopy (MFM) employs a vertically magnetized atomic force microscopy probe to measure sample topography and local magnetic field strength with nanoscale resolution. Optimizing MFM spatial resolution and sensitivity requires balancing decreasing lift height against increasing drive (oscillation) amplitude, and benefits from operating in an inert atmosphere glovebox.

Explore More Videos

Magnetic Force MicroscopyMFMNanoscaleMagnetic DomainsSpin-wave ComputingArtificial Spin IcesMagnetization TexturesHigh-resolution MFMAFM ProbeMagnetic CoatingVertically MagnetizedLaser AlignmentPosition-sensitive DetectorSample Holder

Read Article

Cite this Article

Parker, A. C., Maryon, O. O., Kaffash, M. T., Jungfleisch, M. B., Davis, P. H. Optimizing Magnetic Force Microscopy Resolution and Sensitivity to Visualize Nanoscale Magnetic Domains. J. Vis. Exp. (185), e64180, doi:10.3791/64180 (2022).

Download .ris file

Copy

Share Video

.

Copy