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Co-lokalisatie kelvin probe force microscopie met andere microscopieën en spectroscopieën: geselecteerde toepassingen in corrosiekarakterisering van legeringen
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Engineering
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JoVE Journal Engineering
Co-localizing Kelvin Probe Force Microscopy with Other Microscopies and Spectroscopies: Selected Applications in Corrosion Characterization of Alloys
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Co-lokalisatie kelvin probe force microscopie met andere microscopieën en spectroscopieën: geselecteerde toepassingen in corrosiekarakterisering van legeringen

Nederlands

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2,102 Views

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12:18 min

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June 27, 2022

DOI:

10.3791/64102-v

DOI:
10.3791/64102-v

•

12:18 min
June 27, 2022

•

4 Views
, , , , ,
1Micron School of Materials Science & Engineering,Boise State University, 2Material, Physical, and Chemical Sciences Center,Sandia National Laboratories, 3Center for Advanced Energy Studies

Summary

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Kelvin probe force microscopie (KPFM) meet oppervlaktetopografie en verschillen in oppervlaktepotentiaal, terwijl scanning elektronenmicroscopie (SEM) en bijbehorende spectroscopieën oppervlaktemorfologie, samenstelling, kristalliniteit en kristallografische oriëntatie kunnen ophelderen. Dienovereenkomstig kan de co-lokalisatie van SEM met KPFM inzicht geven in de effecten van nanoschaalsamenstelling en oppervlaktestructuur op corrosie.

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Kelvin Probe Force Microscopy (KPFM)Scanning Electron Microscopy (SEM)ColocalizationCorrosion CharacterizationAlloysSurface PotentialSurface TopographyMaterial StructureProperty PerformanceSample PreparationConductive PathAFM Probe

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Cite this Article

Maryon, O. O., Efaw, C. M., DelRio, F. W., Graugnard, E., Hurley, M. F., Davis, P. H. Co-localizing Kelvin Probe Force Microscopy with Other Microscopies and Spectroscopies: Selected Applications in Corrosion Characterization of Alloys. J. Vis. Exp. (184), e64102, doi:10.3791/64102 (2022).

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