Co-localizing Kelvin Probe Force Microscopy with Other Microscopies and Spectroscopies: Selected Applications in Corrosion Characterization of Alloys

Olivia O. Maryon; Corey M. Efaw; Frank W. DelRio; Elton Graugnard; Michael F. Hurley; Paul  H. Davis

doi:10.3791/64102

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Co-localizing Kelvin Probe Force Microscopy with Other Microscopies and Spectroscopies: Selected Applications in Corrosion Characterization of Alloys

JoVE Journal
工学
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JoVE Journal 工学

Co-localizing Kelvin Probe Force Microscopy with Other Microscopies and Spectroscopies: Selected Applications in Corrosion Characterization of Alloys

2,094 Views

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12:18 min

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June 27, 2022

DOI:

10.3791/64102-v

DOI:

10.3791/64102-v

•

12:18 min

June 27, 2022

•

4 Views

Olivia O. Maryon*¹, Corey M. Efaw*¹, Frank W. DelRio², Elton Graugnard^1,3, Michael F. Hurley^1,3, Paul H. Davis^1,3

¹Micron School of Materials Science & Engineering,Boise State University, ²Material, Physical, and Chemical Sciences Center,Sandia National Laboratories, ³Center for Advanced Energy Studies

概要

Kelvin probe force microscopy (KPFM) measures surface topography and differences in surface potential, while scanning electron microscopy (SEM) and associated spectroscopies can elucidate surface morphology, composition, crystallinity, and crystallographic orientation. Accordingly, the co-localization of SEM with KPFM can provide insight into the effects of nanoscale composition and surface structure on corrosion.

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Kelvin Probe Force Microscopy (KPFM)Scanning Electron Microscopy (SEM)Colocalization Corrosion Characterization Alloys Surface Potential Surface Topography Material Structure Property Performance Sample Preparation Conductive Path AFM Probe

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Co-localizing Kelvin Probe Force Microscopy with Other Microscopies and Spectroscopies: Selected Applications in Corrosion Characterization of Alloys

概要

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