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Co-localizing Kelvin Probe Force Microscopy with Other Microscopies and Spectroscopies: Selected Applications in Corrosion Characterization of Alloys
JoVE 杂志
工程学
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JoVE 杂志 工程学
Co-localizing Kelvin Probe Force Microscopy with Other Microscopies and Spectroscopies: Selected Applications in Corrosion Characterization of Alloys

Co-localizing Kelvin Probe Force Microscopy with Other Microscopies and Spectroscopies: Selected Applications in Corrosion Characterization of Alloys

2,093 Views

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12:18 min

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June 27, 2022

DOI:

10.3791/64102-v

DOI:
10.3791/64102-v

•

12:18 min
June 27, 2022

•

4 Views
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1Micron School of Materials Science & Engineering,Boise State University, 2Material, Physical, and Chemical Sciences Center,Sandia National Laboratories, 3Center for Advanced Energy Studies

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Kelvin probe force microscopy (KPFM) measures surface topography and differences in surface potential, while scanning electron microscopy (SEM) and associated spectroscopies can elucidate surface morphology, composition, crystallinity, and crystallographic orientation. Accordingly, the co-localization of SEM with KPFM can provide insight into the effects of nanoscale composition and surface structure on corrosion.

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Kelvin Probe Force Microscopy (KPFM)Scanning Electron Microscopy (SEM)ColocalizationCorrosion CharacterizationAlloysSurface PotentialSurface TopographyMaterial StructureProperty PerformanceSample PreparationConductive PathAFM Probe

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Maryon, O. O., Efaw, C. M., DelRio, F. W., Graugnard, E., Hurley, M. F., Davis, P. H. Co-localizing Kelvin Probe Force Microscopy with Other Microscopies and Spectroscopies: Selected Applications in Corrosion Characterization of Alloys. J. Vis. Exp. (184), e64102, doi:10.3791/64102 (2022).

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