Journal
/
Chemistry
/
Picometer-Precision Atomic Position Tracking through Electron Microscopy
JoVE Journal
Chemistry
Author Produced
This content is Free Access.
JoVE Journal Chemistry
Picometer-Precision Atomic Position Tracking through Electron Microscopy

Picometer-Precision Atomic Position Tracking through Electron Microscopy

English

Automatically Generated

5,776 Views

•

15:04 min

•

July 03, 2021

DOI:

10.3791/62164-v

DOI:
10.3791/62164-v

•

15:04 min
July 03, 2021

•

10 Views
, , ,
1Department of Materials Science & Engineering,The Pennsylvania State University, 2Center for Nanophase Materials Sciences,Oak Ridge National Laboratory

Summary

Automatically generated

This work presents a workflow for atomic position tracking in atomic resolution transmission electron microscopy imaging. This workflow is performed using an open-source Matlab app (EASY-STEM).

Explore More Videos

Atomic Position TrackingElectron MicroscopyAberration CorrectionSTEM ImagingAtomic ResolutionLattice StrainDefectsImage DenoisingDrift CorrectionAtom Column QuantificationOverlapping AtomsMATLAB ApplicationEasySTEM

Read Article

Cite this Article

Miao, L., Chmielewski, A., Mukherjee, D., Alem, N. Picometer-Precision Atomic Position Tracking through Electron Microscopy. J. Vis. Exp. (173), e62164, doi:10.3791/62164 (2021).

Download .ris file

Copy

Share Video

.

Copy