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Пикометрическое точное отслеживание положения атомов с помощью электронной микроскопии
JoVE Journal
Chemistry
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JoVE Journal Chemistry
Picometer-Precision Atomic Position Tracking through Electron Microscopy
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Пикометрическое точное отслеживание положения атомов с помощью электронной микроскопии

5,623 Views

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15:04 min

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July 03, 2021

DOI:

10.3791/62164-v

DOI:
10.3791/62164-v

•

15:04 min
July 03, 2021

•

12 Views
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1Department of Materials Science & Engineering,The Pennsylvania State University, 2Center for Nanophase Materials Sciences,Oak Ridge National Laboratory

Tags

Atomic Position TrackingElectron MicroscopyAberration CorrectionSTEM ImagingAtomic ResolutionLattice StrainDefectsImage DenoisingDrift CorrectionAtom Column QuantificationOverlapping AtomsMATLAB ApplicationEasySTEM

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Miao, L., Chmielewski, A., Mukherjee, D., Alem, N. Picometer-Precision Atomic Position Tracking through Electron Microscopy. J. Vis. Exp. (173), e62164, doi:10.3791/62164 (2021).

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