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In Situ Transmission Electron Microscopy with Biasing and Fabrication of Asymmetric Crossbars Basierend auf Mixed-Phased a-VOx
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In Situ Transmission Electron Microscopy with Biasing and Fabrication of Asymmetric Crossbars Based on Mixed-Phased a-VOx
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In Situ Transmission Electron Microscopy with Biasing and Fabrication of Asymmetric Crossbars Basierend auf Mixed-Phased a-VOx

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3,869 Views

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09:49 min

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May 13, 2020

DOI:

10.3791/61026-v

DOI:
10.3791/61026-v

•

09:49 min
May 13, 2020

•

12 Views
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1Functional Materials and Microsystems Research Group and the Micro Nano Research Facility,RMIT University, 2RMIT Microscopy and Microanalysis Facility,RMIT University

Summary

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Hier wird ein Protokoll zur Analyse nanostruktureller Veränderungen während der In-situ-Biasing mit Transmissionselektronenmikroskopie (TEM) für eine gestapelte Metall-Isolator-Metall-Struktur vorgestellt. Es hat signifikante Anwendungen in resistive Schaltquerträger für die nächste Generation von programmierbaren Logikschaltungen und neuromimicking Hardware, um ihre zugrunde liegenden Operation Mechanismen und praktische Anwendbarkeit zu offenbaren.

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Nirantar, S., Mayes, E., Sriram, S. In Situ Transmission Electron Microscopy with Biasing and Fabrication of Asymmetric Crossbars Based on Mixed-Phased a-VOx. J. Vis. Exp. (159), e61026, doi:10.3791/61026 (2020).

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