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Электрохимическое травление и характеристика точек Sharp поля излучения для ионизацией электронным ударом
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Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization
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Электрохимическое травление и характеристика точек Sharp поля излучения для ионизацией электронным ударом

9,299 Views

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06:58 min

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July 12, 2016

DOI:

10.3791/54030-v

DOI:
10.3791/54030-v

•

06:58 min
July 12, 2016

•

1 Views
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1Department of Physics,Central Michigan University

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Electrochemical EtchingField Emission Points (FEPs)Tungsten RodsElectron Impact IonizationMass SpectrometrySodium Hydroxide SolutionDC Power SupplyCopper CathodeFEP Catcher Block

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Van Well, T. L., Redshaw, M., Gamage, N. D., Kandegedara, R. M. E. B. Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization. J. Vis. Exp. (113), e54030, doi:10.3791/54030 (2016).

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