/
/
Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization
Un abonnement à JoVE est nécessaire pour voir ce contenu. Connectez-vous ou commencez votre essai gratuit.
Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization
9,321 Views
•
06:58 min
•
July 12, 2016
DOI:
Summary
Automatically generated
A method for electrochemically etching field emission tips is presented. Etching parameters are characterized and the operation of the tips in field emission mode is investigated.
Read Article
Cite this Article
Van Well, T. L., Redshaw, M., Gamage, N. D., Kandegedara, R. M. E. B. Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization. J. Vis. Exp. (113), e54030, doi:10.3791/54030 (2016).
Copy