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Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization
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July 12, 2016
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A method for electrochemically etching field emission tips is presented. Etching parameters are characterized and the operation of the tips in field emission mode is investigated.
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Van Well, T. L., Redshaw, M., Gamage, N. D., Kandegedara, R. M. E. B. Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization. J. Vis. Exp. (113), e54030, doi:10.3791/54030 (2016).
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