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Electrochemical Eau-forte et caractérisation des points de Sharp émission de champ pour ionisation par impact électronique

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Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization

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Electrochemical Eau-forte et caractérisation des points de Sharp émission de champ pour ionisation par impact électronique

9,299 Views

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06:58 min

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July 12, 2016

DOI:

10.3791/54030-v

DOI:

10.3791/54030-v

•

06:58 min

July 12, 2016

•

1 Views

Tyler L. Van Well, Matthew Redshaw, Nadeesha D. Gamage, R. M. Eranjan B. Kandegedara

¹Department of Physics,Central Michigan University

Tags

Electrochemical Etching Field Emission Points (FEPs)Tungsten Rods Electron Impact Ionization Mass Spectrometry Sodium Hydroxide Solution DC Power Supply Copper Cathode FEP Catcher Block

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