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Elektrokemisk Ætsning og karakterisering af Sharp Field Emission Point for Electron Impact ionisering
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Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization

Elektrokemisk Ætsning og karakterisering af Sharp Field Emission Point for Electron Impact ionisering

9,299 Views

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06:58 min

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July 12, 2016

DOI:

10.3791/54030-v

DOI:
10.3791/54030-v

•

06:58 min
July 12, 2016

•

1 Views
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1Department of Physics,Central Michigan University

Tags

Electrochemical EtchingField Emission Points (FEPs)Tungsten RodsElectron Impact IonizationMass SpectrometrySodium Hydroxide SolutionDC Power SupplyCopper CathodeFEP Catcher Block

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Van Well, T. L., Redshaw, M., Gamage, N. D., Kandegedara, R. M. E. B. Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization. J. Vis. Exp. (113), e54030, doi:10.3791/54030 (2016).

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