Journal
/
Engenharia
/
Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization
JoVE Journal
Engenharia
É necessária uma assinatura da JoVE para visualizar este conteúdo.  Faça login ou comece sua avaliação gratuita.
JoVE Journal Engenharia
Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization

Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization

DOI:
10.3791/54030-v

•

06:58 min

•

July 12, 2016

•

, , ,
1Department of Physics,Central Michigan University

Capítulos

  • 00:05Título
  • 00:45Material Preparations
  • 01:45Apparatus Preparations, Etching and Collecting
  • 03:29Field Emission Point Testing
  • 05:27Results: Etching through FEP Testing
  • 06:32Conclusion

Summary

Tadução automática

Tadução automática

A method for electrochemically etching field emission tips is presented. Etching parameters are characterized and the operation of the tips in field emission mode is investigated.

Tags

Electrochemical EtchingField Emission Points (FEPs)Tungsten RodsElectron Impact IonizationMass SpectrometrySodium Hydroxide SolutionDC Power SupplyCopper CathodeFEP Catcher Block

Article

Embed

ADICIONAR À PLAYLIST

Usage Statistics

Vídeos Relacionados

check_url/pt/54030?article_type=v

Fabrication of VB2/Air Cells for Electrochemical Testing
check_url/pt/54030?article_type=v

Spatial Separation of Molecular Conformers and Clusters
check_url/pt/54030?article_type=v

Characterization of Recombination Effects in a Liquid Ionization Chamber Used for the Dosimetry of a Radiosurgical Accelerator
check_url/pt/54030?article_type=v

Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization
check_url/pt/54030?article_type=v

Protocol of Electrochemical Test and Characterization of Aprotic Li-O2 Battery
check_url/pt/54030?article_type=v

Emission Spectroscopic Boundary Layer Investigation during Ablative Material Testing in Plasmatron
check_url/pt/54030?article_type=v

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
check_url/pt/54030?article_type=v

Fabrication of White Light-emitting Electrochemical Cells with Stable Emission from Exciplexes
check_url/pt/54030?article_type=v

One-Step Approach to Fabricating Polydimethylsiloxane Microfluidic Channels of Different Geometric Sections by Sequential Wet Etching Processes
check_url/pt/54030?article_type=v

Method Development for Contactless Resonant Cavity Dielectric Spectroscopic Studies of Cellulosic Paper

Read Article