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Cryo-electron Microscopy Specimen Preparation By Means Of a Focused Ion Beam
 

Cryo-electron Microscopy Specimen Preparation By Means Of a Focused Ion Beam

Article DOI: 10.3791/51463-v • 10:54 min • July 26th, 2014
July 26th, 2014 •
1,4, 3, 2, 1
1Department of Engineering Sciences, Uppsala University, 2Gatan Inc., 3Department of Microbiology, Swedish University of Agricultural Sciences, 4Physics Department, University of Oslo

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Cryo Electron Microscopes, either Scanning (SEM) or Transmission (TEM), are widely used for characterization of biological samples or other materials with a high water content1. A SEM/Focused Ion Beam (FIB) is used to identify features of interest in samples and extract a thin, electron-transparent lamella for transfer to a cryo-TEM.

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Keywords: Cryo-electron Microscopy Focused Ion Beam Specimen Preparation Aspergillus Niger Cryo-TEM Cryo-SEM Lamella Extraction TEM Grid Electron Transparency Cryo-transfer Station Nanomanipulator Contamination
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