Journal
/
Biologia
/
低温电子显微镜样品制备借助于聚焦离子束
JoVE Journal
Biologia
This content is Free Access.
JoVE Journal Biologia
Cryo-electron Microscopy Specimen Preparation By Means Of a Focused Ion Beam
Please note that all translations are automatically generated. Click here for the English version.

低温电子显微镜样品制备借助于聚焦离子束

26,060 Views

•

10:54 min

•

July 26, 2014

DOI:

10.3791/51463-v

DOI:
10.3791/51463-v

•

10:54 min
July 26, 2014

•

5 Views
, , ,
1Department of Engineering Sciences,Uppsala University, 2Gatan Inc., 3Department of Microbiology,Swedish University of Agricultural Sciences, 4Physics Department,University of Oslo

Tags

Cryo-electron MicroscopyFocused Ion BeamSpecimen PreparationAspergillus NigerCryo-TEMCryo-SEMLamella ExtractionTEM GridElectron TransparencyCryo-transfer StationNanomanipulatorContamination

Read Article

Cite this Article

Rubino, S., Melin, P., Spellward, P., Leifer, K. Cryo-electron Microscopy Specimen Preparation By Means Of a Focused Ion Beam. J. Vis. Exp. (89), e51463, doi:10.3791/51463 (2014).

Download .ris file

Copy

Share Video

.

Copy