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Рентгеновский луч индуцированных текущих измерений для мульти-модальной рентгеновской микроскопии солнечных клеток

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X-ray Beam Induced Current Measurements for Multi-Modal X-ray Microscopy of Solar Cells

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Рентгеновский луч индуцированных текущих измерений для мульти-модальной рентгеновской микроскопии солнечных клеток

13,214 Views

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00:10 min

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August 20, 2019

DOI:

10.3791/60001-v

DOI:

10.3791/60001-v

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00:10 min

August 20, 2019

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6 Views

Christina Ossig³, Tara Nietzold, Bradley West, Mariana Bertoni, Gerald Falkenberg, Christian G. Schroer³, Michael E. Stuckelberger

¹Deutsches Elektronen-Synchrotron, ²School of Electrical, Computer and Energy Engineering,Arizona State University, ³Department Physik,Universität Hamburg

Tags

X-ray Beam Induced Current (XBIC)Multi-modal X-ray Microscopy Solar Cells Charge Collection Efficiency Semiconductor Devices Sample Holder Printed Circuit Board Spatial Resolution Grounding Beam Footprint

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