Journal
/
공학
/
קרן רנטגן המושרה מדידות נוכחיות עבור מיקרוסקופית רנטגן רב-מודאליים של תאים סולאריים
JoVE 신문
공학
This content is Free Access.
JoVE 신문 공학
X-ray Beam Induced Current Measurements for Multi-Modal X-ray Microscopy of Solar Cells
Please note that all translations are automatically generated. Click here for the English version.

קרן רנטגן המושרה מדידות נוכחיות עבור מיקרוסקופית רנטגן רב-מודאליים של תאים סולאריים

13,214 Views

•

00:10 min

•

August 20, 2019

DOI:

10.3791/60001-v

DOI:
10.3791/60001-v

•

00:10 min
August 20, 2019

•

6 Views
, , , , , ,
1Deutsches Elektronen-Synchrotron, 2School of Electrical, Computer and Energy Engineering,Arizona State University, 3Department Physik,Universität Hamburg

Tags

X-ray Beam Induced Current (XBIC)Multi-modal X-ray MicroscopySolar CellsCharge Collection EfficiencySemiconductor DevicesSample HolderPrinted Circuit BoardSpatial ResolutionGroundingBeam Footprint

Read Article

Cite this Article

Ossig, C., Nietzold, T., West, B., Bertoni, M., Falkenberg, G., Schroer, C. G., Stuckelberger, M. E. X-ray Beam Induced Current Measurements for Multi-Modal X-ray Microscopy of Solar Cells. J. Vis. Exp. (150), e60001, doi:10.3791/60001 (2019).

Download .ris file

Copy

Share Video

.

Copy