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Cryo-microscopia elettronica Preparazione del campione per mezzo di un Focused Ion Beam
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Cryo-electron Microscopy Specimen Preparation By Means Of a Focused Ion Beam
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Cryo-microscopia elettronica Preparazione del campione per mezzo di un Focused Ion Beam

26,060 Views

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10:54 min

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July 26, 2014

DOI:

10.3791/51463-v

DOI:
10.3791/51463-v

•

10:54 min
July 26, 2014

•

5 Views
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1Department of Engineering Sciences,Uppsala University, 2Gatan Inc., 3Department of Microbiology,Swedish University of Agricultural Sciences, 4Physics Department,University of Oslo

Tags

Cryo-electron MicroscopyFocused Ion BeamSpecimen PreparationAspergillus NigerCryo-TEMCryo-SEMLamella ExtractionTEM GridElectron TransparencyCryo-transfer StationNanomanipulatorContamination

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Rubino, S., Melin, P., Spellward, P., Leifer, K. Cryo-electron Microscopy Specimen Preparation By Means Of a Focused Ion Beam. J. Vis. Exp. (89), e51463, doi:10.3791/51463 (2014).

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