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Cryo-electron Microscopy Specimen Preparation By Means Of a Focused Ion Beam
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Cryo-electron Microscopy Specimen Preparation By Means Of a Focused Ion Beam

Cryo-electron Microscopy Specimen Preparation By Means Of a Focused Ion Beam

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26,171 Views

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10:54 min

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July 26, 2014

DOI:

10.3791/51463-v

DOI:
10.3791/51463-v

•

10:54 min
July 26, 2014

•

4 Views
, , ,
1Department of Engineering Sciences,Uppsala University, 2Gatan Inc., 3Department of Microbiology,Swedish University of Agricultural Sciences, 4Physics Department,University of Oslo

Summary

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Cryo Electron Microscopes, either Scanning (SEM) or Transmission (TEM), are widely used for characterization of biological samples or other materials with a high water content1. A SEM/Focused Ion Beam (FIB) is used to identify features of interest in samples and extract a thin, electron-transparent lamella for transfer to a cryo-TEM.

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Cite this Article

Rubino, S., Melin, P., Spellward, P., Leifer, K. Cryo-electron Microscopy Specimen Preparation By Means Of a Focused Ion Beam. J. Vis. Exp. (89), e51463, doi:10.3791/51463 (2014).

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