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אלומת יונים ממוקדת כרסום מיקרוסקופיית אלקטרונים של רקמת המוח
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Focussed Ion Beam Milling and Scanning Electron Microscopy of Brain Tissue
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אלומת יונים ממוקדת כרסום מיקרוסקופיית אלקטרונים של רקמת המוח

27,569 Views

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08:57 min

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July 06, 2011

DOI:

10.3791/2588-v

DOI:
10.3791/2588-v

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08:57 min
July 06, 2011

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1 Views
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1Centre of interdisciplinary electron microscopy,École Polytechnique Fédérale de Lausanne

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Focussed Ion Beam MillingScanning Electron MicroscopyFIB/SEM ProtocolAldehydes FixationHeavy Metal StainingOsmium TetroxideUranyl AcetateDehydrationResin InfiltrationUltramicrotomeGlass KnivesBlock PreparationVertical Face MillingBackscattered Electron ImagingSerial ImagingIsotropic VoxelsCell Ultrastructure Analysis

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Knott, G., Rosset, S., Cantoni, M. Focussed Ion Beam Milling and Scanning Electron Microscopy of Brain Tissue. J. Vis. Exp. (53), e2588, doi:10.3791/2588 (2011).

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