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Focussed Ion Beam Milling and Scanning Electron Microscopy of Brain Tissue
JoVE Journal
Neurociência
This content is Free Access.
JoVE Journal Neurociência
Focussed Ion Beam Milling and Scanning Electron Microscopy of Brain Tissue

Focussed Ion Beam Milling and Scanning Electron Microscopy of Brain Tissue

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08:57 min

July 06, 2011

DOI:

08:57 min
July 06, 2011

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Summary

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This protocol describes how resin embedded brain tissue can be prepared and imaged in the three dimensions in the focussed ion beam, scanning electron microscope.

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