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Focussed Ion Beam Milling and Scanning Electron Microscopy of Brain Tissue
JoVE Journal
Neurowissenschaften
This content is Free Access.
JoVE Journal Neurowissenschaften
Focussed Ion Beam Milling and Scanning Electron Microscopy of Brain Tissue

Focussed Ion Beam Milling and Scanning Electron Microscopy of Brain Tissue

DOI:

08:57 min

July 06, 2011

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Kapitel

  • 00:05Titel
  • 01:29Sample Fixation and Resin Embedding
  • 04:00Preparing the Sample for the FIB/SEM
  • 05:55Imaging the FIB/SEM
  • 08:03Results: FIB/SEM Images of Brain Tissue
  • 08:40Conclusion

Summary

Automatische Übersetzung

This protocol describes how resin embedded brain tissue can be prepared and imaged in the three dimensions in the focussed ion beam, scanning electron microscope.

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