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Gericht Ion Beam Frezen en Scanning Electron Microscopy van hersenweefsel

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신경과학

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Focussed Ion Beam Milling and Scanning Electron Microscopy of Brain Tissue

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Gericht Ion Beam Frezen en Scanning Electron Microscopy van hersenweefsel

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08:57 min

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July 06, 2011

DOI:

DOI:

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08:57 min

July 06, 2011

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1 Views

Graham Knott, Stéphanie Rosset, Marco Cantoni

¹Centre of interdisciplinary electron microscopy,École Polytechnique Fédérale de Lausanne

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Focussed Ion Beam Milling Scanning Electron Microscopy FIB/SEM Protocol Aldehydes Fixation Heavy Metal Staining Osmium Tetroxide Uranyl Acetate Dehydration Resin Infiltration Ultramicrotome Glass Knives Block Preparation Vertical Face Milling Backscattered Electron Imaging Serial Imaging Isotropic Voxels Cell Ultrastructure Analysis

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