/

/

聚焦离子束铣削和脑组织的扫描电子显微镜

JoVE 신문
신경과학

This content is Free Access.

JoVE 신문 신경과학

Focussed Ion Beam Milling and Scanning Electron Microscopy of Brain Tissue

Please note that all translations are automatically generated. Click here for the English version.

聚焦离子束铣削和脑组织的扫描电子显微镜

27,565 Views

•

08:57 min

•

July 06, 2011

DOI:

DOI:

•

08:57 min

July 06, 2011

•

1 Views

Graham Knott, Stéphanie Rosset, Marco Cantoni

¹Centre of interdisciplinary electron microscopy,École Polytechnique Fédérale de Lausanne

Tags

Focussed Ion Beam Milling Scanning Electron Microscopy FIB/SEM Protocol Aldehydes Fixation Heavy Metal Staining Osmium Tetroxide Uranyl Acetate Dehydration Resin Infiltration Ultramicrotome Glass Knives Block Preparation Vertical Face Milling Backscattered Electron Imaging Serial Imaging Isotropic Voxels Cell Ultrastructure Analysis

Read Article