Journal
/
신경과학
/
Focussed Ion Beam Milling and Scanning Electron Microscopy of Brain Tissue
JoVE 신문
신경과학
This content is Free Access.
JoVE 신문 신경과학
Focussed Ion Beam Milling and Scanning Electron Microscopy of Brain Tissue

Focussed Ion Beam Milling and Scanning Electron Microscopy of Brain Tissue

27,573 Views

•

08:57 min

•

July 06, 2011

DOI:

10.3791/2588-v

DOI:
10.3791/2588-v

•

08:57 min
July 06, 2011

•

1 Views
, ,
1Centre of interdisciplinary electron microscopy,École Polytechnique Fédérale de Lausanne

Explore More Videos

Focussed Ion Beam MillingScanning Electron MicroscopyFIB/SEM ProtocolAldehydes FixationHeavy Metal StainingOsmium TetroxideUranyl AcetateDehydrationResin InfiltrationUltramicrotomeGlass KnivesBlock PreparationVertical Face MillingBackscattered Electron ImagingSerial ImagingIsotropic VoxelsCell Ultrastructure Analysis

Read Article

Cite this Article

Knott, G., Rosset, S., Cantoni, M. Focussed Ion Beam Milling and Scanning Electron Microscopy of Brain Tissue. J. Vis. Exp. (53), e2588, doi:10.3791/2588 (2011).

Download .ris file

Copy

Share Video

.

Copy