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電子衝撃イオン化のためのシャープフィールドエミッションポイントの電気化学エッチングとキャラクタリゼーション
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Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization
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電子衝撃イオン化のためのシャープフィールドエミッションポイントの電気化学エッチングとキャラクタリゼーション

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06:58 min

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July 12, 2016

DOI:

10.3791/54030-v

DOI:
10.3791/54030-v

•

06:58 min
July 12, 2016

•

1 Views
, , ,
1Department of Physics,Central Michigan University

Summary

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A method for electrochemically etching field emission tips is presented. Etching parameters are characterized and the operation of the tips in field emission mode is investigated.

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Cite this Article

Van Well, T. L., Redshaw, M., Gamage, N. D., Kandegedara, R. M. E. B. Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization. J. Vis. Exp. (113), e54030, doi:10.3791/54030 (2016).

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