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Nanoschaalkarakterisering van vloeistof-vaste interfaces door cryo-gerichte ionenbundelfrezen te koppelen aan scanningelektronenmicroscopie en spectroscopie
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JoVE Journal Engineering
Nanoscale Characterization of Liquid-Solid Interfaces by Coupling Cryo-Focused Ion Beam Milling with Scanning Electron Microscopy and Spectroscopy
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Nanoschaalkarakterisering van vloeistof-vaste interfaces door cryo-gerichte ionenbundelfrezen te koppelen aan scanningelektronenmicroscopie en spectroscopie

Nederlands

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3,220 Views

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11:03 min

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July 14, 2022

DOI:

10.3791/61955-v

DOI:
10.3791/61955-v

•

11:03 min
July 14, 2022

•

12 Views
, ,
1School of Applied and Engineering Physics,Cornell University, 2Kavli Institute at Cornell for Nanoscale Science

Summary

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Cryogenic Focused Ion Beam (FIB) en Scanning Electron Microscopy (SEM) technieken kunnen belangrijke inzichten bieden in de chemie en morfologie van intacte vast-vloeistof interfaces. Methoden voor het voorbereiden van hoogwaardige Energy Dispersive X-ray (EDX) spectroscopische kaarten van dergelijke interfaces zijn gedetailleerd, met een focus op energieopslagapparaten.

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Cite this Article

Moon, T., Colletta, M., Kourkoutis, L. F. Nanoscale Characterization of Liquid-Solid Interfaces by Coupling Cryo-Focused Ion Beam Milling with Scanning Electron Microscopy and Spectroscopy. J. Vis. Exp. (185), e61955, doi:10.3791/61955 (2022).

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