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Nanoscale Characterization of Liquid-Solid Interfaces by Coupling Cryo-Focused Ion Beam Milling with Scanning Electron Microscopy and Spectroscopy
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Nanoscale Characterization of Liquid-Solid Interfaces by Coupling Cryo-Focused Ion Beam Milling with Scanning Electron Microscopy and Spectroscopy

Nanoscale Characterization of Liquid-Solid Interfaces by Coupling Cryo-Focused Ion Beam Milling with Scanning Electron Microscopy and Spectroscopy

DOI:
10.3791/61955-v

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11:03 min

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July 14, 2022

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, ,
1School of Applied and Engineering Physics,Cornell University, 2Kavli Institute at Cornell for Nanoscale Science

章

  • 00:04Introduction
  • 00:29Scanning Electron Microscope (SEM) and Cryogenic Station Preparation
  • 01:31Sample Vitrification
  • 02:51Sample Surface Imaging and Feature Location
  • 04:19Cross-Section Preparation
  • 06:52Energy Dispersive X-Ray (EDX) Mapping
  • 08:12Results: Representative Nanoscale Liquid-Solid Interface Characterization
  • 10:24Conclusion

概要

自動翻訳

自動翻訳

Cryogenic Focused Ion Beam (FIB) and Scanning Electron Microscopy (SEM) techniques can provide key insights into the chemistry and morphology of intact solid-liquid interfaces. Methods for preparing high quality Energy Dispersive X-ray (EDX) spectroscopic maps of such interfaces are detailed, with a focus on energy storage devices.

タグ

Cryo-SEMFIBLiquid-solid InterfacesBiological SamplesSample PreparationCryogenic CoolingVitrificationScanning Electron MicroscopySpectroscopyNanoscale Characterization

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