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제조 및 반 데르 발스 Heteroepitaxy에 따라 유연한 Ferroelectric 요소에 대 한 측정 방법
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Engineering
A Fabrication and Measurement Method for a Flexible Ferroelectric Element Based on Van Der Waals Heteroepitaxy
Please note that all translations are automatically generated.
Click here for the English version.
제조 및 반 데르 발스 Heteroepitaxy에 따라 유연한 Ferroelectric 요소에 대 한 측정 방법
DOI:
10.3791/57221-v
•
10:40 min
•
April 08, 2018
•
Jie Jiang*
1
,
Yugandhar Bitla*
2
,
Qiang-xiang Peng
,
Yi-Chun Zhou
,
Ying-Hao Chu
1
Key Laboratory of Low Dimensional Materials and Application Technology of Ministry of Education
,
Xiangtan University
,
2
Department of Physics
,
Indian Institute of Science
,
3
Department of Materials Science and Engineering
,
National Chiao Tung University
Chapters
00:00
Title
00:41
Fabricate the Flexible PZT Thin Film
02:19
Ferroelectric Characterization: Bending Test
04:28
Ferroelectric Characterization: Thermal Stability
05:19
Ferroelectric Characterization: Bending Cyclability Tests
06:23
Results: Ferroelectric Properties Under Bent and High Temperature
08:41
Conclusion
Summary
Automatic Translation
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Automatic Translation
이 논문에서 우리 직접 아직 코피는 성장 하는 프로토콜 유연한 리드 지르코늄 타이타늄 메모리 요소에 현재 모스크바 운 모.
Tags
Flexible Ferroelectric Element
Van Der Waals Heteroepitaxy
PZT Thin Film
Mica Substrate
PLD
SRO Bottom Electrode
Platinum Top Electrode
Ferroelectric Characterization
Bending Test
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