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A Fabrication and Measurement Method for a Flexible Ferroelectric Element Based on Van Der Waals Heteroepitaxy
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A Fabrication and Measurement Method for a Flexible Ferroelectric Element Based on Van Der Waals Heteroepitaxy

A Fabrication and Measurement Method for a Flexible Ferroelectric Element Based on Van Der Waals Heteroepitaxy

DOI:
10.3791/57221-v

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10:40 min

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April 08, 2018

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, , , ,
1Key Laboratory of Low Dimensional Materials and Application Technology of Ministry of Education,Xiangtan University, 2Department of Physics,Indian Institute of Science, 3Department of Materials Science and Engineering,National Chiao Tung University

Chapters

  • 00:00Title
  • 00:41Fabricate the Flexible PZT Thin Film
  • 02:19Ferroelectric Characterization: Bending Test
  • 04:28Ferroelectric Characterization: Thermal Stability
  • 05:19Ferroelectric Characterization: Bending Cyclability Tests
  • 06:23Results: Ferroelectric Properties Under Bent and High Temperature
  • 08:41Conclusion

Summary

Automatic Translation

Automatic Translation

In this paper, we present a protocol to directly grow an epitaxial yet flexible lead zirconium titanate memory element on muscovite mica.

Tags

Flexible Ferroelectric ElementVan Der Waals HeteroepitaxyPZT Thin FilmMica SubstratePLDSRO Bottom ElectrodePlatinum Top ElectrodeFerroelectric CharacterizationBending Test

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