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A Fabrication and Measurement Method for a Flexible Ferroelectric Element Based on Van Der Waals Heteroepitaxy
JoVE 杂志
工程学
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JoVE 杂志 工程学
A Fabrication and Measurement Method for a Flexible Ferroelectric Element Based on Van Der Waals Heteroepitaxy

A Fabrication and Measurement Method for a Flexible Ferroelectric Element Based on Van Der Waals Heteroepitaxy

DOI:

10:40 min

April 08, 2018

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Chapters

  • 00:00Title
  • 00:41Fabricate the Flexible PZT Thin Film
  • 02:19Ferroelectric Characterization: Bending Test
  • 04:28Ferroelectric Characterization: Thermal Stability
  • 05:19Ferroelectric Characterization: Bending Cyclability Tests
  • 06:23Results: Ferroelectric Properties Under Bent and High Temperature
  • 08:41Conclusion

Summary

自动翻译

In this paper, we present a protocol to directly grow an epitaxial yet flexible lead zirconium titanate memory element on muscovite mica.

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