Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics

Mon-Shu Ho; Chih-Pong Huang; Jyun-Hwei Tsai; Che-Fu Chou; Wen-Jay Lee

doi:10.3791/54235

Journal

/

Engineering

/

التحقيق C 84 -embedded سي الركيزة عن طريق المجهر التحقيقي وحيوية الجزيئية

JoVE Journal
Engineering

A subscription to JoVE is required to view this content. Sign in or start your free trial.

JoVE Journal Engineering

Probing C₈₄-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics

Please note that all translations are automatically generated. Click here for the English version.

التحقيق C 84 -embedded سي الركيزة عن طريق المجهر التحقيقي وحيوية الجزيئية

11,564 Views

•

13:58 min

•

September 28, 2016

DOI:

10.3791/54235-v

DOI:

10.3791/54235-v

•

13:58 min

September 28, 2016

•

12 Views

Mon-Shu Ho¹, Chih-Pong Huang², Jyun-Hwei Tsai³, Che-Fu Chou¹, Wen-Jay Lee³

¹Department of Physics and Institute of Nanoscience,National Chung Hsing University, ²Metallurgy Section, Materials & Electro-Optics Research Division,National Chung-Shan Institute of Science and Technology, ³National Center for High-Performance Computing

Summary

This paper reports the nanomaterial fabrication of a fullerene Si substrate inspected and verified by nanomeasurements and molecular dynamic simulation.

Explore More Videos

C84-embedded Si Substrate Scanning Probe Microscopy Molecular Dynamics Nanomaterials Nanostructures Silicon (111) Substrate C84 Deposition Fullerene UHV-STM Heterojunction Electronic Properties Optoelectronic Properties Mechanical Properties Magnetic Properties Field Emission Properties

Read Article

التحقيق C<sub> 84</sub> -embedded سي الركيزة عن طريق المجهر التحقيقي وحيوية الجزيئية

Automatically Generated

Summary

Automatically generated

Explore More Videos